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Toku, H. Alper. (2013).
[IEEE 2013 IEEE AUTOTESTCON - Schaumburg, IL, USA (2013.09.16-2013.09.19)] 2013 IEEE AUTOTESTCON - Developing new Automatic Test Equipments (ATE) using systematic design approaches. , (), 1–7.
doi:10.1109/AUTEST.2013.6645035
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