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Scheinert, Susanne; Pernstich, Kurt P.; Batlogg, Bertram; Paasch, Gernot . (2007). Determination of trap distributions from current characteristics of pentacene field-effect transistors with surface modified gate oxide. Journal of Applied Physics, 102(10), 104503–. doi:10.1063/1.2803742 
10.1063/1.2803742